In situ measurements of the structure and  strain of a π-conjugated semiconducting  polymer under mechanical load

dc.contributor.author	BENOUDIA Mohamed Cherif (Co-Auteur)
dc.date.accessioned	2025-09-15T10:31:46Z
dc.date.available	2025-09-15T10:31:46Z
dc.date.issued	2020
dc.description	J. Appl. Phys. 127, 045108 (2020); doi: 10.1063/1.5127226
dc.description.abstract	In this work, in situ studies of organic thin films under stretching are developed. A high efficiency PffBT4T-2OD π-conjugated polymer (PCE11) was coated directly on a stretchable substrate in order to examine the impact of tensile strain on the structural properties. For that purpose, in situ grazing incidence x-ray diffraction coupled with optical microscopic observations have been carried out to measure the structural parameters of PCE11 and to probe the mechanical behavior of polymer chains under uniaxial tensile load. It is observed that in the range between 0% and 15%–20% of stretching, the polymer chains become more oriented. Meanwhile, an increase in negative values of deformation, i.e., compression of the polymer chains along the film normal was measured. Beyond this range of stretching, the polymer order declined and the stress was relaxed. This relaxation is explained by the increased number of cracks spreading over the entire film as observed using optical microscopy.
dc.identifier.uri	http://41.111.199.50:4000/handle/123456789/808
dc.language.iso	en
dc.publisher	Journal of Applied Physics
dc.title	In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load
dc.type	Article

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